“Differential electron yield imaging with STXM”
Performing SEEBIC-Like Conductivity Mapping with an X-Ray Microscope
“Electronic activity previously invisible to electron microscopes revealed”
UCLA Press Release
"Electron beam-induced current imaging with two-angstrom resolution”
First Demonstration of Atomic Resolution STEM EBIC Imaging
“STEM Imaging with Beam-Induced Hole and Secondary Electron Currents”
First Demonstration of Secondary Electron Emission EBIC (SEEBIC)
Winner of 2019 Microscopy Today Innovation Award for SEEBIC
le to electron microscopes revealed” (Press Release)