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“Differential electron yield imaging with STXM”

Performing SEEBIC-Like Conductivity Mapping with an X-Ray Microscope 

 

“Electronic activity previously invisible to electron microscopes revealed”

UCLA Press Release

 

 

"Electron beam-induced current imaging with two-angstrom resolution”

First Demonstration of Atomic Resolution STEM EBIC Imaging

“STEM Imaging with Beam-Induced Hole and Secondary Electron Currents”

First Demonstration of Secondary Electron Emission EBIC (SEEBIC)

Winner of 2019 Microscopy Today Innovation Award for SEEBIC

le to electron microscopes revealed” (Press Release)

NanoElectronic Imaging, Inc.
Los Angeles, CA  90025
Est. 2017