NanoElectronic Imaging

“Differential electron yield imaging with STXM”

Performing SEEBIC-Like Conductivity Mapping with an X-Ray Microscope

“Electronic activity previously invisible to electron microscopes revealed”

UCLA Press Release

"Electron beam-induced current imaging with two-angstrom resolution”

First Demonstration of Atomic Resolution STEM EBIC Imaging

“STEM Imaging with Beam-Induced Hole and Secondary Electron Currents”

First Demonstration of Secondary Electron Emission EBIC (SEEBIC)

Winner of 2019 Microscopy Today Innovation Award for SEEBIC

le to electron microscopes revealed” (Press Release)